作者: M. Ohto, K. Tanaka,
期刊: Applied Physics Letters (AIP Available online 1997) 卷期: Volume 71, issue 23
页码: 3409-3411
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120350
出版商: AIP
数据来源: AIP
摘要:
Electronic structures of Ag–As–Se glasses, which possess ion-hole mixed conduction, have been studied using a scanning tunneling microscope operating in tunneling-spectroscopy modes. The tunneling spectra show marked dependence on the scan speed of tip voltage. This scan-speed dependence appears to be caused byAg+-ion migration which is induced by electric fields generated by tips. ©1997 American Institute of Physics.
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