Phase contrast hard x-ray microscopy with submicron resolution
作者:
S. Lagomarsino,
A. Cedola,
P. Cloetens,
S. Di Fonzo,
W. Jark,
G. Soullie´,
C. Riekel,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 18
页码: 2557-2559
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119324
出版商: AIP
数据来源: AIP
摘要:
In this letter we present a hard x-ray phase contrast microscope based on the divergent and coherent beam exiting an x-ray waveguide. It uses lensless geometrical projection to magnify spatial variations in optical path length more than 700 times. Images of a nylon fiber and a gold test pattern were obtained with a resolution of 0.14 &mgr;m in one direction. Exposure times as short as 0.1 s gave already visible contrast, opening the way to high resolution, real time studies. ©1997 American Institute of Physics.
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