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Phase contrast hard x-ray microscopy with submicron resolution

 

作者: S. Lagomarsino,   A. Cedola,   P. Cloetens,   S. Di Fonzo,   W. Jark,   G. Soullie´,   C. Riekel,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 18  

页码: 2557-2559

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119324

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In this letter we present a hard x-ray phase contrast microscope based on the divergent and coherent beam exiting an x-ray waveguide. It uses lensless geometrical projection to magnify spatial variations in optical path length more than 700 times. Images of a nylon fiber and a gold test pattern were obtained with a resolution of 0.14 &mgr;m in one direction. Exposure times as short as 0.1 s gave already visible contrast, opening the way to high resolution, real time studies. ©1997 American Institute of Physics.

 

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