首页   按字顺浏览 期刊浏览 卷期浏览 An ultrahigh vacuum scanning tunneling microscope for use at variable temperature from ...
An ultrahigh vacuum scanning tunneling microscope for use at variable temperature from 10 to 400 K

 

作者: Sebastian Horch,   Peter Zeppenfeld,   Rudolf David,   George Comsa,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1994)
卷期: Volume 65, issue 10  

页码: 3204-3210

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1145219

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on the construction of an ultrahigh vacuum (UHV) scanning tunneling microscope (STM) specially designed for operation in the entire range of sample temperatures between 10 and 400 K. The sample is cooled by means of a liquid helium continuous‐flow cryostat, while the supporting manipulator and the surrounding devices remain at room temperature. This allows rapid variation of the sample temperature. The standard instruments for surface preparation and analysis and the STM are contained in a single UHV chamber. By rotation of the manipulator the sample can be positioned in front of any of these instruments without changing the sample temperature. The performance of the microscope is demonstrated by two examples of images of xenon adsorbed on platinum(111) showing: (a) the evolution of the morphology of a submonolayer of xenon from adsorption at 17K up to desorption at about 90 K and (b) atomically resolved images of the hexagonal incommensurate rotated phase for xenon at monolayer completion.  

 

点击下载:  PDF (996KB)



返 回