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A microfabricated tip for simultaneous acquisition of sample topography and high-frequency magnetic field

 

作者: V. Agrawal,   P. Neuzil,   D. W. van der Weide,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 16  

页码: 2343-2345

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.120073

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report a combined &mgr;m-level topography and high-frequency magnetic field probe, a 6 &mgr;m loop defined on a scanning-force microscope cantilever. Since it functions as a near-zone antenna, it can be used with any suitable detector, and can probe both active and passive samples. We demonstrate its performance by scanning a coplanar waveguide sample at 10 GHz using a microwave network analyzer. With this instrument, the device noise at this frequency is∼2&mgr;&Fgr;0/Hz1/2atT=300 K, comparable to that found for a superconducting quantum interference device (SQUID) at DC. Unlike the SQUID, however, the thermally limited minimum-detectable field of this system scales with frequency. ©1997 American Institute of Physics.

 

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