A microfabricated tip for simultaneous acquisition of sample topography and high-frequency magnetic field
作者:
V. Agrawal,
P. Neuzil,
D. W. van der Weide,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 16
页码: 2343-2345
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120073
出版商: AIP
数据来源: AIP
摘要:
We report a combined &mgr;m-level topography and high-frequency magnetic field probe, a 6 &mgr;m loop defined on a scanning-force microscope cantilever. Since it functions as a near-zone antenna, it can be used with any suitable detector, and can probe both active and passive samples. We demonstrate its performance by scanning a coplanar waveguide sample at 10 GHz using a microwave network analyzer. With this instrument, the device noise at this frequency is∼2&mgr;&Fgr;0/Hz1/2atT=300 K, comparable to that found for a superconducting quantum interference device (SQUID) at DC. Unlike the SQUID, however, the thermally limited minimum-detectable field of this system scales with frequency. ©1997 American Institute of Physics.
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