Optical force microscopy with silicone rubber waveguides
作者:
S. Herminghaus,
M. Riedel,
P. Leiderer,
M. Bastmeyer,
C. Stu¨rmer,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 1
页码: 22-24
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119292
出版商: AIP
数据来源: AIP
摘要:
A simple technique is described for optically imaging the lateral distribution of normal forces exerted onto a flat surface. It is based on the detuning of a silicone rubber planar waveguide by the forces to be investigated. The method is demonstrated by imaging the contact line force of a sessile water droplet on the surface, with a force resolution better than &mgr;N. It is shown that the lateral resolution may be much better than the decay length of the waveguide modes used. ©1997 American Institute of Physics.
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