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Optical force microscopy with silicone rubber waveguides

 

作者: S. Herminghaus,   M. Riedel,   P. Leiderer,   M. Bastmeyer,   C. Stu¨rmer,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 1  

页码: 22-24

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119292

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A simple technique is described for optically imaging the lateral distribution of normal forces exerted onto a flat surface. It is based on the detuning of a silicone rubber planar waveguide by the forces to be investigated. The method is demonstrated by imaging the contact line force of a sessile water droplet on the surface, with a force resolution better than &mgr;N. It is shown that the lateral resolution may be much better than the decay length of the waveguide modes used. ©1997 American Institute of Physics.

 

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