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Change in the diode quality factor with insulator layer thickness in a metal‐insulator‐n‐semiconductor solar cell

 

作者: Anju Goel,   T. P. Sharma,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 57, issue 8  

页码: 2973-2974

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.335499

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The theoretical calculations for the diode quality factornfor a metal‐insulator‐n‐semiconductor solar cell under illumination are presented here. These calculations show that, under illumination,nincreases with increasingdand decreases slightly ford>18 A˚ atJL=36 mA cm−2. Results of the calculations compare well with experimental results observed by H. C. Card [Solid‐State Electron.20, 971 (1977)].

 

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