Ellipsometric characterization of amorphous and polycrystalline silicon films deposited using a single wafer reactor
作者:
A. Borghesi,
M. E. Giardini,
M. Marazzi,
A. Sassella,
G. De Santi,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 7
页码: 892-894
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118306
出版商: AIP
数据来源: AIP
摘要:
The optical functions of amorphous and polycrystalline silicon thin films deposited on single oxidized silicon substrates by chemical vapor deposition in a wide range of deposition temperatures have been determined using spectroscopic ellipsometry. The data analysis is performed by direct inversion of the experimental spectra, therefore, obtaining results independent of any film modeling. The optical results indicate that the film structure changes as the deposition temperature increases from amorphous to polycrystalline with different grain size and distribution. ©1997 American Institute of Physics.
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