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Graphical Method for Estimation of Contrast in Electron Microscopy

 

作者: P. Sadhukhan,  

 

期刊: Journal of Applied Physics  （AIP Available online 1958）
卷期: Volume 29, issue 8  

页码: 1235-1237

 

ISSN:0021-8979

 

年代: 1958

 

DOI:10.1063/1.1723409

 

出版商: AIP

 

数据来源: AIP

 

摘要:

In the preparation of shadowed specimens for electron microscopic examination, it is often required to estimate the contrast to be expected with different thicknesses of films of various metals, different aperture angles, and beam potentials. This communication describes a graphical method for this purpose.

 

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