Heterojunctions of solid C70 and crystalline silicon: Rectifying properties and barrier heights
作者:
K. M. Chen,
K. Wu,
Y. Chen,
Y. Q. Jia,
S. X. Jin,
C. Y. Li,
Z. N. Gu,
X. H. Zhou,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 67,
issue 12
页码: 1683-1685
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.115056
出版商: AIP
数据来源: AIP
摘要:
Heterojunctions of solid C70 andn‐ orp‐type crystalline Si have been made. Current–voltage measurements show that both C70/n‐Si and C70/p‐Si contacts are rectifying but their directions of rectification are opposite to each other. Thermal activation measurements at a fixed forward bias show an exponential dependence of current on the reciprocal of temperature, from which we determine the effective barrier height as 0.23 eV for C70/n‐Si and 0.27 eV for C70/p‐Si. Relative dielectric constant of solid C70 was determined to be 4.96 through the study of high‐frequency capacitance–voltage characteristics for Ti/C70/p‐Si structures. ©1995 American Institute of Physics.
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