The basic principals underpinning the technique of polarised Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy using synchrotron radiation are described with particular relevance to the technique's application in the structural characterisation of organic surfaces and interfaces. Experimental data, recorded in the ultra-soft spectral region close to the C and N K-edges (ca. 200eV to 500eV) on beamline U1 A at the Brookhaven National Synchrotron Light Source (NSLS) is presented including applications to thin films of long chain hydrocarbons, LB films, anti-corrosion coatings and organic single crystals.