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Impact ionization in GaAs: Distribution of final electron states determined from hydrostatic pressure measurements

 

作者: J. Allam,   A. R. Adams,   M. A. Pate,   J. S. Roberts,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 22  

页码: 3304-3306

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115228

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have measured the avalanche breakdown voltage (Vb) in GaAsp‐i‐ndiodes as a function of hydrostatic pressure up to 14 kbar. The pressure coefficient ofVbwas small and opposite in sign compared to that of the band gap. A lucky‐drift calculation ofVbincluding the effects of pressure on both the phonon scattering and ionization rates showed that the ionization threshold energy does not scale with the band gap. Instead, the effective threshold scales with an average of the energies of the &Ggr;,X, andLconduction‐band minima. This is direct evidence that pair production yields final electron states distributed between conduction‐band valleys. ©1995 American Institute of Physics.

 

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