It is shown from step annealing data for the 002 x‐ray diffraction peak that the processes annealing below 200 °C possess a frequency factor ∼1014sec−1, while those processes annealing at higher temperatures possess much lower frequency factors. This is attributed to the lower‐temperature processes being associated with the movement of single carbon interstitial atoms and the higher‐temperature processes being associated with more complex configurations, including clusters of carbon atoms.