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Optical window in strained‐layer Si/Ge microstructures

 

作者: Michael Gell,  

 

期刊: Applied Physics Letters  (AIP Available online 1989)
卷期: Volume 55, issue 5  

页码: 484-485

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.101860

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Theoretical predictions are presented of electronic and optical properties of the Si/Ge (2:6) superlattice grown on (001) SiGe buffers. It is shown that the buffer layer on which the superlattice is grown controls the polarization isotropy of the fundamental cross‐gap transition and may be used to engineer an optical window for direct gap behavior.

 

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