Polytetrafluorethylene (PTFE) is a technologically important material employed for broad applications due to its exceptional properties for lubrication, insulation, and chemical inertness. With regard to surface analysis, PTFE has been found to provide a ready standard source for the x-ray photoelectron F 1sline in a polymeric matrix. A previous submission [M. Ackeret, Surf. Sci. Spectra1, 100 (1992)] examined the uniformity of the atomic composition over the surface layers by angle dependent XPS analysis of the C 1sand F 1slines. In this submission we wish to present a compilation of the photoelectron, Auger, and valence band transitions excited by monochromatic Al x-ray radiation.