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X-radiography of electrical components

 

作者: R.Taylor,  

 

期刊: Proceedings of the IEE - Part A: Power Engineering  (IET Available online 1962)
卷期: Volume 109, issue 3S  

页码: 203-205

 

年代: 1962

 

DOI:10.1049/pi-a.1962.0033

 

出版商: IEE

 

数据来源: IET

 

摘要:

X-radiography can reveal internal features of importance in certain components. This has been applied to the inspection of resistors, short-circuiting fuses, terminal seals and radio valves required to be of high quality, and to the detection of faults in these components and in capacitors. The usefulness of the technique is demonstrated.

 

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