X-radiography of electrical components
作者:
R.Taylor,
期刊:
Proceedings of the IEE - Part A: Power Engineering
(IET Available online 1962)
卷期:
Volume 109,
issue 3S
页码: 203-205
年代: 1962
DOI:10.1049/pi-a.1962.0033
出版商: IEE
数据来源: IET
摘要:
X-radiography can reveal internal features of importance in certain components. This has been applied to the inspection of resistors, short-circuiting fuses, terminal seals and radio valves required to be of high quality, and to the detection of faults in these components and in capacitors. The usefulness of the technique is demonstrated.
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