A Comparison of Accelerated Test Plans to Estimate the Survival Probability at a Design Stress
作者:
WilliamQ. Meeker,
GeraldJ. Hahn,
期刊:
Technometrics
(Taylor Available online 1978)
卷期:
Volume 20,
issue 3
页码: 245-247
ISSN:0040-1706
年代: 1978
DOI:10.1080/00401706.1978.10489668
出版商: Taylor & Francis Group
关键词: Life testing;Accelerated testing;Reliability;Logistic model
数据来源: Taylor
摘要:
In a previous paper [3], the authors presented large sample optimum accelerated test plans to estimate the survival probability at a design stress assuming a linear logistic model, i.e. a linear relationship between stress and the log survival odds at that stress. The optimum plans required testing at two accelerated stresses with a larger allocation of units assigned to the lower of the two stresses. In practice, however, it is often desirable to conduct the accelerated tests at more than two stresses and/or use equal or otherwise prespecified allocation. In this paper we compare the large sample variance of each of ten such non-optimum test plans (and also that of testing exclusively at the design stress) with that of the optimum plan under a variety of conditions.
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