首页   按字顺浏览 期刊浏览 卷期浏览 A Comparison of Accelerated Test Plans to Estimate the Survival Probability at a Design...
A Comparison of Accelerated Test Plans to Estimate the Survival Probability at a Design Stress

 

作者: WilliamQ. Meeker,   GeraldJ. Hahn,  

 

期刊: Technometrics  (Taylor Available online 1978)
卷期: Volume 20, issue 3  

页码: 245-247

 

ISSN:0040-1706

 

年代: 1978

 

DOI:10.1080/00401706.1978.10489668

 

出版商: Taylor & Francis Group

 

关键词: Life testing;Accelerated testing;Reliability;Logistic model

 

数据来源: Taylor

 

摘要:

In a previous paper [3], the authors presented large sample optimum accelerated test plans to estimate the survival probability at a design stress assuming a linear logistic model, i.e. a linear relationship between stress and the log survival odds at that stress. The optimum plans required testing at two accelerated stresses with a larger allocation of units assigned to the lower of the two stresses. In practice, however, it is often desirable to conduct the accelerated tests at more than two stresses and/or use equal or otherwise prespecified allocation. In this paper we compare the large sample variance of each of ten such non-optimum test plans (and also that of testing exclusively at the design stress) with that of the optimum plan under a variety of conditions.

 

点击下载:  PDF (338KB)



返 回