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Reversibility of parameter changes of microchannel electron multipliers due to outgassing

 

作者: J. P. Rager,   J. F. Renaud,   V. Tezenas du Montcel,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1974）
卷期: Volume 45, issue 7  

页码: 927-928

 

ISSN:0034-6748

 

年代: 1974

 

DOI:10.1063/1.1686770

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The changes in the gain and strip current characteristics of a microchannel electron multiplier which are caused by outgassing due to ir baking were investigated. Baking at 200°C caused only reversible outgassing. Baking at 250°C for six hours produces irreversible changes. Detailed descriptions of the experimental set up and the controls performed during the baking are given.

 

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