首页   按字顺浏览 期刊浏览 卷期浏览 Photocatalytic oxidation for point‐of‐use abatement of volatile organic compounds in mi...
Photocatalytic oxidation for point‐of‐use abatement of volatile organic compounds in microelectronics manufacturing

 

作者: Gregory B. Raupp,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1995)
卷期: Volume 13, issue 4  

页码: 1883-1887

 

ISSN:1071-1023

 

年代: 1995

 

DOI:10.1116/1.587829

 

出版商: American Vacuum Society

 

关键词: TITANIUM OXIDES;ORGANIC COMPOUNDS;VOLATILE MATTER;OXIDATION;CHEMICAL RADIATION EFFECTS;NEAR ULTRAVIOLET RADIATION;CATALYSIS;MICROELECTRONICS;LITHOGRAPHY;TiO2

 

数据来源: AIP

 

摘要:

In gas–solid heterogeneous photocatalytic oxidation (PCO), volatile organic compounds (VOCs) present in process air or air vents can be rapidly and completely oxidized to innocuous by‐products over a near‐ultraviolet (UV) illuminated titanium dioxide thin film catalyst at room temperature. This class of advanced oxidation processes appears to be well‐suited for point‐of‐use VOC abatement in the microelectronics manufacturing industry. In this article, we review industrial requirements and unresolved technical issues in the context of the recently published Semiconductor Industry Association roadmap. The specific requirements for VOC abatement from a typical photolithography track are presented. Bench‐scale PCO kinetics for target VOCs are reviewed to demonstrate the typical process behavior expected.

 

点击下载:  PDF (167KB)



返 回