首页   按字顺浏览 期刊浏览 卷期浏览 The effect of interface roughness and island scattering on resonant tunneling time
The effect of interface roughness and island scattering on resonant tunneling time

 

作者: H. C. Liu,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 1  

页码: 593-595

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.345204

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The effect of interface roughness and island scattering on resonant tunneling time in double‐barrier structures is investigated theoretically. The scattering process degrades the resonant tunneling peak current, broadens the resonance, and hence shortens the resonant tunneling time. For thin barrier structures, the tunneling time enhancement due to the scattering is relatively small, while the resonance width is dominated by the scattering for thick barrier samples.

 

点击下载:  PDF (321KB)



返 回