The electrical resistivity of a series of Co‐Cr multilayered thin films (MLS) of equal layer thickness of ∼30–30 A˚ made at various substate temperatures and deposition rates of 0.5 and 2 A˚/s was measured over the temperature range of 4.2–350 K. The most striking feature seen in several of these MLS was that the bump near the Ne´el temperatureTNof the spin‐density wave (SDW) of Cr was 2–4 times greater than that seen inCrCo alloys. The bump in the MLS is also much sharper than that of the alloys. The resistivity bump and an increase inTNin the alloys has been attributed to an enhancement of the SDW due to the exchange interaction between the Co moments and the SDW. It is proposed that the even larger enhancement of the SDW in the MLS is due to the superlattice structure of the MLS. This changes the Cr Fermi surface by introducing new Brillouin zones and thus increases the nesting which gives rise to the SDW. The variation of theTNvalues of the MLS varies systematically with the substrate temperature. Other similarities and differences between the MLS and the alloys resistivity behavior are discussed.