首页   按字顺浏览 期刊浏览 卷期浏览 White‐beam synchrotron topographic characterization of flux‐grown KTiOAsO4
White‐beam synchrotron topographic characterization of flux‐grown KTiOAsO4

 

作者: W. J. Liu,   S. S. Jiang,   X. R. Huang,   X. B. Hu,   C. Z. Ge,   J. Y. Wang,   J. H. Jiang,   Z. G. Wang,  

 

期刊: Applied Physics Letters  （AIP Available online 1996）
卷期: Volume 68, issue 1  

页码: 25-27

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.116744

 

出版商: AIP

 

数据来源: AIP

 

摘要:

KTiOAsO4crystals grown from tungstate fluxes have been studied by white‐beam synchrotron radiation topography. It is shown that growth striations are primary planar defects. By anomalous scattering, ferroelectric domains in KTA are investigated and the ratio of ‖F(004)‖2to ‖F(004¯)‖2is calculated. The mechanisms of domain inversion via 2‐fold axis orn‐glide plane are also discussed in terms of the structural characteristics of KTA. ©1996 American Institute of Physics.

 

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