White‐beam synchrotron topographic characterization of flux‐grown KTiOAsO4
作者:
W. J. Liu,
S. S. Jiang,
X. R. Huang,
X. B. Hu,
C. Z. Ge,
J. Y. Wang,
J. H. Jiang,
Z. G. Wang,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 1
页码: 25-27
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.116744
出版商: AIP
数据来源: AIP
摘要:
KTiOAsO4crystals grown from tungstate fluxes have been studied by white‐beam synchrotron radiation topography. It is shown that growth striations are primary planar defects. By anomalous scattering, ferroelectric domains in KTA are investigated and the ratio of ‖F(004)‖2to ‖F(004¯)‖2is calculated. The mechanisms of domain inversion via 2‐fold axis orn‐glide plane are also discussed in terms of the structural characteristics of KTA. ©1996 American Institute of Physics.
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