Steady‐state mobility lifetimes and photoconductivity ina‐SiGe:H thin films
作者:
Steven S. Hegedus,
James M. Cebulka,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 67,
issue 8
页码: 3885-3888
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.344991
出版商: AIP
数据来源: AIP
摘要:
The steady‐state mobility‐lifetime products (&eegr;&mgr;&tgr;) and photoconductivity spectra ofa‐Si:H anda‐SiGe:H films with band gaps from 1.74 to 1.10 eV have been determined. The importance of obtaining the bulk &eegr;&mgr;&tgr; at an appropriate wavelength for films of differing compositions and absorption spectra is demonstrated. We show that &eegr;&mgr;&tgr; measured at a wavelength such that the absorption‐thickness product is unity (&agr;t=1) is proportional to the standard photoconductivity measured at one sun illumination for films having a wide range of band gaps and deposition conditions.
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