首页   按字顺浏览 期刊浏览 卷期浏览 Steady‐state mobility lifetimes and photoconductivity ina‐SiGe:H thin fil...
Steady‐state mobility lifetimes and photoconductivity ina‐SiGe:H thin films

 

作者: Steven S. Hegedus,   James M. Cebulka,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 8  

页码: 3885-3888

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.344991

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The steady‐state mobility‐lifetime products (&eegr;&mgr;&tgr;) and photoconductivity spectra ofa‐Si:H anda‐SiGe:H films with band gaps from 1.74 to 1.10 eV have been determined. The importance of obtaining the bulk &eegr;&mgr;&tgr; at an appropriate wavelength for films of differing compositions and absorption spectra is demonstrated. We show that &eegr;&mgr;&tgr; measured at a wavelength such that the absorption‐thickness product is unity (&agr;t=1) is proportional to the standard photoconductivity measured at one sun illumination for films having a wide range of band gaps and deposition conditions.

 

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