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Ionization rates for electrons and holes in GaAs

 

作者: Masanori Ito,   Shuzo Kagawa,   Takao Kaneda,   Toyoshi Yamaoka,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 8  

页码: 4607-4608

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.325443

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ionization rates in GaAs are determined from the measurement of photocarrier multiplication. Pure electron and hole initiations are achieved by using the novel crater mesa structure and appropriate optical‐injection wavelengths. The ionization rates for holes are greater than that for electrons except at highest fields. This agrees with the studies of Stillmanetal., except for the individual values. The ionization rates for electrons and holes are expressed as &agr;=5.6×106 exp(−2.41×106/E) and &bgr;=1.5×106 exp(−1.57×106/E), respectively.

 

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