Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration
作者:
P. C. Yang,
Y. Chen,
M. Vaez‐Iravani,
期刊:
Journal of Applied Physics
(AIP Available online 1992)
卷期:
Volume 71,
issue 6
页码: 2499-2502
ISSN:0021-8979
年代: 1992
DOI:10.1063/1.351064
出版商: AIP
数据来源: AIP
摘要:
An attractive‐mode atomic force microscope is described in which the cantilever is held orthogonally with respect to the sample. The technique utilizes a linear differential optical detection scheme for the cantilever vibrations. In this design, the cantilever end is not bent to form a tip. This geometry substantially reduces the possibility of spontaneous jump‐to‐contact of the tip onto the sample, allowing the tip/sample separation to be set essentially to any desired value. Relatively large‐ and small‐scale results are presented on imaging a smear of red blood cells, demonstrating the resolution and sensitivity.
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