首页   按字顺浏览 期刊浏览 卷期浏览 Attractive‐mode atomic force microscopy with optical detection in an orthogonal ...
Attractive‐mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration

 

作者: P. C. Yang,   Y. Chen,   M. Vaez‐Iravani,  

 

期刊: Journal of Applied Physics  (AIP Available online 1992)
卷期: Volume 71, issue 6  

页码: 2499-2502

 

ISSN:0021-8979

 

年代: 1992

 

DOI:10.1063/1.351064

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An attractive‐mode atomic force microscope is described in which the cantilever is held orthogonally with respect to the sample. The technique utilizes a linear differential optical detection scheme for the cantilever vibrations. In this design, the cantilever end is not bent to form a tip. This geometry substantially reduces the possibility of spontaneous jump‐to‐contact of the tip onto the sample, allowing the tip/sample separation to be set essentially to any desired value. Relatively large‐ and small‐scale results are presented on imaging a smear of red blood cells, demonstrating the resolution and sensitivity.

 

点击下载:  PDF (514KB)



返 回