Requirements for highly reliable VLSI multilevel interconnection
作者:
Yusuke Ohtomo,
Kazuyoshi Nishimura,
期刊:
AIP Conference Proceedings
(AIP Available online 1998)
卷期:
Volume 418,
issue 1
页码: 14-24
ISSN:0094-243X
年代: 1998
DOI:10.1063/1.54637
出版商: AIP
数据来源: AIP
摘要:
The wire delay in the deep-submicron era increases in proportion to the square of a scaling factork.The computer-aided design tool described here routes multilevel wires with variable width and spacings reduces the dependence of specified local net delay to dependence on1/kand reduces the dependence of specified global net delay to dependence onk.The increase in the number of specified nets in future LSIs makes LSI design prohibitively complex unless a multilevel interconnection using a low-resistivity material or a low-permittivity material is used. The design tool might also be useful in improving the electromigration hardness of the structure, but some of the parameters for this are still unknown. ©1998 American Institute of Physics.
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