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Requirements for highly reliable VLSI multilevel interconnection

 

作者: Yusuke Ohtomo,   Kazuyoshi Nishimura,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1998)
卷期: Volume 418, issue 1  

页码: 14-24

 

ISSN:0094-243X

 

年代: 1998

 

DOI:10.1063/1.54637

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The wire delay in the deep-submicron era increases in proportion to the square of a scaling factork.The computer-aided design tool described here routes multilevel wires with variable width and spacings reduces the dependence of specified local net delay to dependence on1/kand reduces the dependence of specified global net delay to dependence onk.The increase in the number of specified nets in future LSIs makes LSI design prohibitively complex unless a multilevel interconnection using a low-resistivity material or a low-permittivity material is used. The design tool might also be useful in improving the electromigration hardness of the structure, but some of the parameters for this are still unknown. ©1998 American Institute of Physics.

 

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