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Reference Materials at Low Temperatures

 

作者: G. K. White,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1974)
卷期: Volume 17, issue 1  

页码: 1-7

 

ISSN:0094-243X

 

年代: 1974

 

DOI:10.1063/1.2945923

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Measurements made at the National Standards Laboratory and at Iowa State University of the linear expansion coefficient a for Si, Cu, Ag, Al and Ge below 35 K agree within limits of experimental uncertainty and should constitute reliable reference data. At temperatures from 35 K toca100 K, there are data for Cu measured at NBS and by Rubinet al.which disagree by ∼10 7times; 10−8K−1. From 130 to 230 K these and Russian data agree well but above 230 K they differ, the difference reaching 10 × 10−8K−1 near room temperature. Comparison of &agr;‐values for Si is a useful guide when considering the reliability of these reference data.

 

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