An x‐ray spectrometer based on the Johann bent‐crystal principle is described. An entrance slit system has been adopted which provides excellent protection of the diffracting crystal from metallic vapors. Such an arrangement also provides improved resolution and dispenses with the need for a thin film window between the x‐ray source and spectrometer tank. Resolution comparable to a two plane‐crystal instrument has been attained and systematic studies of the soft x‐ray emissions from liquid metals and alloys and metallic vapors undertaken.