A new method for the study of preferred orientation in polycrystalline materials with a Geiger counter x‐ray spectrometer is described. The unique feature of the method is that a spherical diffraction specimen is employed. Sufficient data for the construction of a complete pole figure may be obtained, and the observed intensities may be plotted directly on a stereographic net without geometry or absorption corrections. The method may be used satisfactorily with the heavy metals since x‐rays are not transmitted through the specimen. A technique for accurately machining and electroetching spherical specimens is given, and the special goniometer used with the spectrometer is described. Sample data are given and their interpretation discussed. The method is compared with other recently developed techniques for the study of preferred orientation.