Magnetic circular dichroism in reflection electron energy loss spectroscopy?
作者:
G. R. Harp,
R. F. C. Farrow,
R. F. Marks,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1996)
卷期:
Volume 14,
issue 4
页码: 3148-3151
ISSN:1071-1023
年代: 1996
DOI:10.1116/1.589078
出版商: American Vacuum Society
关键词: MAGNETIC MATERIALS;THIN FILMS;IRON;COBALT;NICKEL;ENERGY−LOSS SPECTROSCOPY;MAGNETIC CIRCULAR DICHROISM;X−RAY SPECTRA;COMPARATIVE EVALUATIONS;MULTIPLE SCATTERING;SEMICLASSICAL APPROXIMATION;Fe;Co;Ni
数据来源: AIP
摘要:
We evaluate the possibility of using dichroic electron energy loss spectroscopy (DEELS) as an alternative to x‐ray magnetic circular dichroism (XMCD). It is well known that electron energy loss spectroscopy and x‐ray absorption spectroscopy provide similar information. A simple semiclassical model suggests that reflection DEELS might have a magnetic sensitivity similar to that of XMCD. This sensitivity will be reduced, however, by multiple scattering of the probe electron before and after the energy loss event. Thus, it is difficult to predict the magnitude of the DEELS effect. Experiments were performed at theLedges of polycrystalline Fe, Co, and Ni thin‐film samples preparedinsituwith a uniaxial magnetic bias. Even in these most favorable cases, the DEELS effect is limited to less than one‐tenth of related effects in XMCD.
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