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Temperature and flow effects in aluminum etching using bromine‐containing plasmas

 

作者: A. Landauer Keaton,   D. W. Hess,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena  (AIP Available online 1988)
卷期: Volume 6, issue 1  

页码: 72-76

 

ISSN:0734-211X

 

年代: 1988

 

DOI:10.1116/1.584055

 

出版商: American Vacuum Society

 

关键词: SURFACE REACTIONS;ETCHING;ALUMINIUM;BROMINE;BORON BROMIDES;ADSORPTION;Al

 

数据来源: AIP

 

摘要:

The effects of sample temperature and reactant flow rate on aluminum etching in BBr3and BBr3/Br2mixtures were investigated in a parallel‐plate plasma etcher. Etch samples were bonded to the electrode with conductive epoxy to promote thermal equilibrium. Results indicated that the reaction was gas phase controlled between 30 and 140 °C; above 140 °C, the gas phase limitation may be due to reactant adsorption while a product desorption limitation may exist below 30 °C. Transport limitations were encountered at reactant flow rates below 10 sccm.

 

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