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A technique for verifying the alignment of large single crystals

 

作者: J. D. Greiner,   D. M. Bailey,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1974）
卷期: Volume 45, issue 8  

页码: 1032-1033

 

ISSN:0034-6748

 

年代: 1974

 

DOI:10.1063/1.1686801

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A procedure is presented for verifying the alignment of a crystal surface with respect to the x‐ray beam in the back‐reflection Laue technique. The procedure involves the use of a NaCl reference crystal attached to the surface of interest. Application to the determination of the orientation of a skew surface is discussed.

 

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