Electron mobility and minority‐carrier lifetime ofn‐InP single crystals grown by liquid‐encapsulated Czochralski method
作者:
Masafumi Yamaguchi,
Seiji Shinoyama,
Chikao Uemura,
期刊:
Journal of Applied Physics
(AIP Available online 1981)
卷期:
Volume 52,
issue 10
页码: 6429-6431
ISSN:0021-8979
年代: 1981
DOI:10.1063/1.328591
出版商: AIP
数据来源: AIP
摘要:
Correlations between electron mobility, minority‐carrier lifetime, impurity concentration, and dislocation density have been studied in LEC (liquid‐encapsulated Czochralski)‐grown InP single crystals. Mobilities approaching 30 000 cm2/V s at 77 K, which correspond to compensation ratios of 0.2–0.4, have been obtained. Hole lifetimes as high as 3 &mgr;s have been obtained in dislocation‐free single crystals. The experimental results for lifetimes can be explained by a simple model in which dislocation and impurity are considered as recombination centers.
点击下载:
PDF
(153KB)
返 回