In situmonitoring of Raman scattering and photoluminescence from silicon surfaces in HF aqueous solutions
作者:
B. Ren,
F. M. Liu,
J. Xie,
B. W. Mao,
Y. B. Zu,
Z. Q. Tian,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 8
页码: 933-935
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120877
出版商: AIP
数据来源: AIP
摘要:
In situRaman spectra ofSiHx,Si–F, and Si–Si vibrations from Si surfaces in HF aqueous solutions are obtained using a highly sensitive confocal microprobe Raman system. Electrochemical roughening pretreatment and laser-assisted roughening procedure enable good quality surface Raman spectra to be obtained. The surface Raman and photoluminescence spectra from the Si surface in the etching environment and the correlation of the two types of spectra are discussed. The Raman spectroscopy is shown to have high potential in serving as an important tool forin situinvestigating of Si surface bonding during the etching process. ©1998 American Institute of Physics.
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