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X‐ray sensitivity of selenium

 

作者: John L. Donovan,  

 

期刊: Journal of Applied Physics  (AIP Available online 1979)
卷期: Volume 50, issue 10  

页码: 6500-6504

 

ISSN:0021-8979

 

年代: 1979

 

DOI:10.1063/1.325745

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The charge‐generation energy for commerical selenium xeroradiographic plates has been measured. A new technique based on x‐ray‐induced photocurrents was used as well as conventional xeroradiographic discharge measurements. Using x‐ray spectra typical of medical x‐ray irradiations at a conventional applied field of 10 V/&mgr;m, a charge‐generation energy of 30–40 eV per pair was determined. Theoretical estimates related to the band gap predict a pair‐creation energy of 7 eV per pair for selenium.

 

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