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Charge exchange measurements in helium using a double tandem accelerator‐decelerator source of low energy highly stripped oxygen ions

 

作者: J. E. Bayfield,   L. D. Gardner,   Y. Z. Gulkok,   T. K. Saylor,   S. D. Sharma,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1980）
卷期: Volume 51, issue 5  

页码: 651-654

 

ISSN:0034-6748

 

年代: 1980

 

DOI:10.1063/1.1136272

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Cross sections for Oq+‐He single electron capture have been measured for 5⩽q⩽8 within the energy range 15 to 100 keV per amu. High energy positive ions were injected into an EN tandem Van de Graaff operated at a negative voltage, producing even higher energy for foil stripping to high charge states, followed by ion deceleration to reduce the ion energy by as much as a factor of 50.

 

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