Lateral Extensometer for Brittle Materials
作者:
Madan M. Singh,
Yung Sam Kim,
期刊:
Review of Scientific Instruments
(AIP Available online 1967)
卷期:
Volume 38,
issue 6
页码: 769-771
ISSN:0034-6748
年代: 1967
DOI:10.1063/1.1720886
出版商: AIP
数据来源: AIP
摘要:
A design for an extensometer for measuring lateral deformations in brittle materials using LVDT's is presented. The system is sensitive enough to measure the small changes in diameter that occur in such situations, but is simple and inexpensive. The instrumentation technique also allows a choice of electronic equipment, thus making it more versatile. The extensometer may be used for lateral deformation measurements in both compression and tension experiments.
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