首页   按字顺浏览 期刊浏览 卷期浏览 Atomic force microscopy study of electron beam written contamination structures
Atomic force microscopy study of electron beam written contamination structures

 

作者: M. Amman,   J. W. Sleight,   D. R. Lombardi,   R. E. Welser,   M. R. Deshpande,   M. A. Reed,   L. J. Guido,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1996)
卷期: Volume 14, issue 1  

页码: 54-62

 

ISSN:1071-1023

 

年代: 1996

 

DOI:10.1116/1.588429

 

出版商: American Vacuum Society

 

关键词: HYDROCARBONS;SURFACE CONTAMINATION;RADIATION EFFECTS;ELECTRON BEAMS;ELECTRON COLLISIONS;DIFFUSION;SCATTERING THEORY;ATOMIC FORCE MICROSCOPY

 

数据来源: AIP

 

摘要:

Electron radiation induced hydrocarbon contamination can be either a problem or a useful tool in electron beam analyses and lithographies. We have used atomic force microscopy to study electron beam written contamination structures. Contamination is shown not only to arise from the primary electron beam but also from the energy scattered outside of the direct impingement area. The size of the contamination structures correlates well with that expected from electron scattering theory. By varying the geometry of the written structures, the rate at which the electron dose is deposited, and the nearby hydrocarbon surface density, we show that surface diffusion of hydrocarbon molecules plays a primary role in the formation of the contamination structures.

 

点击下载:  PDF (427KB)



返 回