首页   按字顺浏览 期刊浏览 卷期浏览 Transistor abnormalities as revealed by current-voltage characteristics
Transistor abnormalities as revealed by current-voltage characteristics

 

作者: P.J.Holmes,  

 

期刊: Radio and Electronic Engineer  (IET Available online 1969)
卷期: Volume 38, issue 5  

页码: 251-268

 

年代: 1969

 

DOI:10.1049/ree.1969.0107

 

出版商: IERE

 

数据来源: IET

 

摘要:

The examination of a suspect transistor to determine its mode of degradation or failure always includes, at an early stage, checks on its junction and transistor characteristics, usually with the aid of a visual display on a curve tracer. This paper discusses the diagnostic significance of some of the abnormalities which may be observed on such displays.

 

点击下载:  PDF (2334KB)



返 回