Transistor abnormalities as revealed by current-voltage characteristics
作者:
P.J.Holmes,
期刊:
Radio and Electronic Engineer
(IET Available online 1969)
卷期:
Volume 38,
issue 5
页码: 251-268
年代: 1969
DOI:10.1049/ree.1969.0107
出版商: IERE
数据来源: IET
摘要:
The examination of a suspect transistor to determine its mode of degradation or failure always includes, at an early stage, checks on its junction and transistor characteristics, usually with the aid of a visual display on a curve tracer. This paper discusses the diagnostic significance of some of the abnormalities which may be observed on such displays.
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