We present a nondestructive experimental technique for the determination of the lateral distribution of the polar order in second-order nonlinear optical thin films. The sample, which consists of a poled polymer film is scanned through the focus of an infrared laser beam in a second-harmonic generation setup and the second-harmonic intensity is monitored stepwise. In combination with a conventional electro-optic (EO) characterization it is possible to create an EO-coefficient map of the sample. The resolution of this mapping technique can be significantly increased by using high numerical aperture microscope optics for the illumination of the poled polymer. This method, for instance, allows the evaluation of poling inhomogeneities due to high-field poling and field distortions at the edges of poling electrodes. ©1998 American Institute of Physics.