The effect of surface reconstructions on the surface morphology duringin situetching of GaAs
作者:
M. Ritz,
T. Kaneko,
K. Eberl,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 5
页码: 695-697
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119921
出版商: AIP
数据来源: AIP
摘要:
The influence of surface reconstructions on the surface morphology duringin situlayer-by-layer etching of GaAs(001) has been studied based on the observation of reflection high-energy electron-diffraction measurements. For the etching,AsBr3is used as a reactive source etchant under solid source molecular beam epitaxy conditions, focusing on a high temperature region in which the etching rate is limited by a supply rate ofAsBr3resulting in a constant value. Despite the fact that the etching starts on a layer-by-layer basis, an initially smooth surface turns considerably rougher depending on the stoichiometry associated with the surface reconstruction. The best morphology after a removal of 250 nm is obtained in the Ga-rich (3×1) reconstruction region close to the phase transition boundary to the As-rich (2×4). This is also verified by the measurement of scanning electron microscopy and atomic force microscopy. ©1997 American Institute of Physics.
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