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Rotating sample holder for ESR studies of relatively high conductivity, thin samples

 

作者: V. G. Zarifis,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 12  

页码: 2332-2334

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139347

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have designed a low‐loss dielectric sample holder for positioning very thin, metallic, semiconductor samples in a TE102cavity for ESR studies at liquid‐helium temperatures. The sample holder can be rotated ±15° from the center position, allowing accurate positioning of the high‐conductivity sample at minimum electric field. This results in maximizing theQfactor and allowing symmetric excitation on both faces of the sample. We have also devised a method of setting the microwave phase to desired value to better than 0.3° by utilizing the hyperfine lines of a dilute As‐doped Si sample.

 

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