Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy
作者:
Catherine S. Lawson,
Brian J. Tielsch,
Julia E. Fulghum,
期刊:
Surface Science Spectra
(AIP Available online 1996)
卷期:
Volume 4,
issue 4
页码: 316-344
ISSN:1055-5269
年代: 1996
DOI:10.1116/1.1247829
出版商: American Vacuum Society
关键词: XPS;ESCA;x-ray photoelectron spectroscopy
数据来源: AIP
摘要:
XPS spectra have been obtained from six metals in the first row of transition elements using a Kratos AXIS HS x-ray photoelectron spectrometer. The six metals analyzed include Cu, Ni, Zn, V, Ge, and Fe. Each sample was Ar+ion etched before XPS analysis to remove the majority of C and O contamination. The spectra include standard survey scans and high-resolution scans of the photoelectron peaks, as well as x-ray induced Auger peaks. Each spectrum was collected using a monochromatic AlKαx-ray source operated at 300 W (20 mA, 15 kV). Survey scans were collected using an 80 eV pass energy, while high resolution scans were recorded using a 20 eV pass energy unless indicated otherwise.
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