Photocarrier generation, injection, and trapping at the interface in a layered organic photoconductor: Metal‐free phthalocyanine/molecularly doped polymer
作者:
Yoshihiko Kanemitsu,
Shunji Imamura,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 67,
issue 8
页码: 3728-3736
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.345014
出版商: AIP
数据来源: AIP
摘要:
We have studied photocarrier generation and injection at the interface in a double‐layered organic photoconductor consisting of a charge generation layer (CGL) of vacuum‐deposited phthalocyanine film and a charge transport layer (CTL) ofp‐diethylaminobenzaldehyde‐1,1‐diphenyl hydrazone doped polymer film. The photocarrier generation efficiency in the CGL was measured by the photoacoustic method. The transport and trapping of holes in the CTL and at the CGL/CTL interface were studied by xerographic discharge measurements and time‐of‐flight photoconductivity measurements. The photogeneration efficiency in the CGL is affected by the hydrazone concentration in the CTL. At high hydrazone concentrations, the photogeneration efficiency means the quantum efficiency of photocarrier generations controlled by geminate and nongeminate recombination in the CGL. At low hydrazone concentrations, the photogeneration efficiency is affected by the injection and trapping of holes at the CGL/CTL interface. Xerographic and time‐of‐flight photoconductivity measurements show that the lifetime of holes at the CGL/CTL interface is short compared with that in the CTL and no trapping of holes occurs in the CTL. The lifetime of holes at the CGL/CTL interface decreases with increasing hydrazone concentration in the CTL. The injection efficiency of holes is determined by the competition between the trapping of holes at the CGL/CTL interface and the hopping transport of holes across the CGL/CTL interface. We discuss the influence of the hydrazone concentration in the CTL on the photocarrier generation in the CGL and the injection of holes at the CGL/CTL interface.
点击下载:
PDF
(1035KB)
返 回