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Addendum: ‘‘Influence of misfit dislocations on the surface morphology of Si1−xGexfilms’’ [Appl. Phys. Lett.66, 724 (1995)]

 

作者: M. A. Lutz,   R. M. Feenstra,   F. K. LeGoues,   P. M. Mooney,   J. O. Chu,  

 

期刊: Applied Physics Letters  （AIP Available online 1995）
卷期: Volume 67, issue 5  

页码: 724-724

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115287

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The omission of a key reference (Ref. 2) in the authors’ earlier publication (Ref. 1) is noted. The major conclusion of (Ref. 2) was the same as that of the authors’ in (Ref. 1), namely, that surface steps generated by dislocation glide play an important role in the morphology in Si1−xGexfilms. (AIP)

 

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