Regular artificial nanometer‐scale structures fabricated with scanning tunneling microscope
作者:
Q. J. Gu,
N. Liu,
W. B. Zhao,
Z. L. Ma,
Z. Q. Xue,
S. J. Pang,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 14
页码: 1747-1749
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113354
出版商: AIP
数据来源: AIP
摘要:
The scanning tunneling microscope (STM) has been used to fabricate grooves a few nm wide at room temperature by extracting atoms one by one from the Si(111)7×7 surfaces. When the direction of modification is parallel to the basic vector of Si(111)7×7 surfaces, grooves formed by such a process have atomically straight edges and lateral features as small as one 7×7 unit cell wide. The critical current under various voltages for fabricating grooves is measured. The modification mechanism is discussed based on the experiment data in this letter. ©1995 American Institute of Physics.
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