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Regular artificial nanometer‐scale structures fabricated with scanning tunneling microscope

 

作者: Q. J. Gu,   N. Liu,   W. B. Zhao,   Z. L. Ma,   Z. Q. Xue,   S. J. Pang,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 14  

页码: 1747-1749

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113354

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The scanning tunneling microscope (STM) has been used to fabricate grooves a few nm wide at room temperature by extracting atoms one by one from the Si(111)7×7 surfaces. When the direction of modification is parallel to the basic vector of Si(111)7×7 surfaces, grooves formed by such a process have atomically straight edges and lateral features as small as one 7×7 unit cell wide. The critical current under various voltages for fabricating grooves is measured. The modification mechanism is discussed based on the experiment data in this letter. ©1995 American Institute of Physics.

 

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