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An optimized package test methodology for testing FRAM® memories

 

作者: Sanjay Mitra,   James Humes,  

 

期刊: Integrated Ferroelectrics  （Taylor Available online 1999）
卷期: Volume 26, issue 1-4  

页码: 297-310

 

ISSN:1058-4587

 

年代: 1999

 

DOI:10.1080/10584589908215630

 

出版商: Taylor & Francis Group

 

关键词: ferroelectric;retention;test optimization;reliability

 

数据来源: Taylor

 

摘要:

As the market for ferroelectric semiconductor memories matures, the FRAM® products manufactured by Ramtron International Corp are moving into mass production. In this scenario, the optimization of the production test flow becomes a key consideration in the profitability of the product. Ramtron International Corp has thus been focussing on developing an optimized production test flow without compromising the final quality of the product.

 

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