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Beam Scanner for a 1 MeV Van de Graaff

 

作者: W. M. Carra,   J. E. Ehret,   D. R. Locker,   J. M. Meese,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1973）
卷期: Volume 44, issue 9  

页码: 1407-1408

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1686401

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An electron beam scanner is described which is used to produce uniform scans and steering of the electron beam from a 1 MeV Van de Graaff accelerator during electron radiation damage experiments.

 

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