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Broadening of x‐ray diffraction lines from small subgrains containing gradients of spacing

 

作者: C. R. Houska,  

 

期刊: Journal of Applied Physics  (AIP Available online 1978)
卷期: Volume 49, issue 5  

页码: 2991-2993

 

ISSN:0021-8979

 

年代: 1978

 

DOI:10.1063/1.325147

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Recent data on subgrain size and spacing gradients in the Cu‐Ni system allow a more critical examination of a technique currently used to obtain the composition profiles of small diffusion zones. These data support the assumption that the broadening from individual subgrains need not include a spacing gradient term when volume diffusion is predominant. However, care should be taken in the interpretation of the earliest stage of diffusion where grain boundaries, surface, and other defects may introduce large spacing gradients.

 

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