首页   按字顺浏览 期刊浏览 卷期浏览 Construction and application of a 400 kV analytical atom resolution electron microscope
Construction and application of a 400 kV analytical atom resolution electron microscope

 

作者: Hatsujiro Hashimoto,   Hisamitsu Endoh,   Masato Tomita,   Natsuo Ajika,   Masago Kuwabara,   Yoshifumi Hata,   Yoshiyuki Tsubokawa,   Toshikazu Honda,   Yoshiyasu Harada,   Shigekata Sakurai,   Terukazu Etoh,   Yasuhiro Yokota,  

 

期刊: Journal of Electron Microscopy Technique  （WILEY Available online 1986）
卷期: Volume 3, issue 1  

页码: 5-24

 

ISSN:0741-0581

 

年代: 1986

 

DOI:10.1002/jemt.1060030104

 

出版商: Wiley Subscription Services, Inc., A Wiley Company

 

关键词: Atom resolution;Analytical electron microscopes;Fast Fourier transform;On‐line image processing;Energy selecting electron microscopy

 

数据来源: WILEY

 

摘要:

AbstractThe factors defining the resolution limit and the conditions for obtaining images at atomic resolutions are briefly discussed. The construction and performance of a 400 kV analytical atom resolution electron microscope (AARM), and the functions of an energy selecting microscope, X‐ray micro‐analysis, and on‐line image processing systems are described. Some examples of applications of the AARM are

 

点击下载:  PDF (6337KB)



返 回