Photoemission yield measurements were made on amorphous selenium from about 6 to 21 eV. The yield curve exhibits a change in slope at about 7.8 eV corresponding to a maximum in the imaginary dielectric constant. The photoemission threshold is obtained by using a threshold law equation derived by Kane,Y = C(E − Et)n, whereYis the yield,EandEtare the photon energy and threshold energy, andCandnare constants. The yield data up to 8 eV are best represented by the equation withn=52resulting in an extrapolated photoemission threshold of 5.86 eV for amrophous selenium.